Thursday, 17 June 2010

week 9

31.05.2010(Monday)
==================
- Updated SO8 Flat Lead Weekly Yield Monitoring and Focus Defect for week 21.
- Updated Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Updated GRR and bias study for machine P41 and P1.

* Bias study is testing a unit for few times by using the same machine and see how much the
difference(biasing) between the readings recorded.


01.06.2010(Tuesday)
===================
- Continued Update Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Prepared and reviewed the presentation slides with supervisor for internship lecturer visiting.
- Lecturer visiting: 4.00pm - 4.45pm

02.06.2010(Wednesday)
=====================
- Updated GRR, Bias study, Linearity and Stability for machine of type 881. (limit updated:VDSON).
- Learned how to do mapping.
- Continued Update Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Updated Linearity and Stability for machince P36(FT2 and QA).

03.06.2010(Thursday)
====================
- Updated VFP min limit = 0.2 for SMB devices.
- An Excel file was downloaded after the mapping process done yesterday. So, today I needed to
update machine name, final test output quantity, final test yield loss percentage, PAT_LKG
limit for SAW, DIE BOND and FINAL TEST processes in the Excel file.

04.06.2010(Friday)
==================
- Updated IRS current max limit to proposed limit for SMA devices.
- Continued upload VFP min limit = 0.2 for SMB devices.

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