week 12----last week!!!:)

21.06.2010(Monday)

===============

- Updated SO8 Flat Lead Weekly Yield Monitoring and SO8 Flat Lead Focus Defect for week 24.

- Copied limit of SMA normal devices to SMA special devices by using SYA tool.

22.06.2010(Tuesdday)

================

- On leave.

23.06.2010(Wedneaday)

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- On leave.

24.06.2010(Thursday)

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- Copied limit of SMA normal devices to SMA special devices by using SYA tool.

- Used SYA Tool( Create Ad Hoc Calculator) to update SO8 Flat Lead QA program of machine TESEC351.

25.06.2010(Friday)

==============

- It was my last day of internship!

- Since supervisor did not assigned any work to me, the things I did for today was just settle up all the forms, report and log book......and took photos with colleagues and friends.

- Had a farewell dinner with colleagues and friends and night too!happy!:)

~ Got my last month salary..:)

week 11

14.06.2010(Monday)

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- Updated SO8 Flat Lead Yield Loss Monitoring and Focus Defect for week 23.

During the updating process we must always make sure whether there is any new description is added or not. For this week, a new description is added which is Incoming Others Wafer Rejects(QT).

- Updated current IRS PAT limit to proposed max limit and generated report for the updating.

Steps:

------

(a) Download 6 Bin Program from FET_PPD_SMB_6BIN program.

(b) Upload the propsed limit by using Concurrent DOS PC.

(c) Check in the uploaded program into the program in FET_PPD_SMB.

(D) Done and update the latest version of the program in MS Excel.

15.06.2010(Tuesday)

===================

- Continued updating IRS PAT max limit.

- Measured and calculated no. of void, area of die and percentage of voided area of the X-ray

photos taken.

percentage of voided area = (no. of void/ area of die) x 100%

- Recorded RG readings for lot P018S8K00Q and P018S8K00P. 10 readings for each lot are taken where the min limit must be 2.30 ohm.

*RG readings is the resistance of the die.

16.06.2010(Wednesday)

=====================

- Updated IRS PAT max limit for SMB AT3 devices. The days before were updated for AT3G devices.

- Learned to use Statistical Yield Analysis(SYA) tool to copy approved limit selection.

*SYA Tool is used to double confirmed that there is no error occured in the updated program

to avoid problem occuring when running a production.

- Checked whether a lot has been retest or not by using "newtON STDF" program.

Steps:

------

(a) Login to "newtON STDF".

(b) Type the lot number in the "Lot" column and click on "Search" button.

(c) List of program is shown.

(d) If there are only 3 programs are listed, it means that the lot has not been retested.

(f) If there are 6 programs listed, the lot has been retested.

*3 programs represented 3 tested stations of the tester which are FT, QA and RG.

17.06.2010(Thursday)

====================

- Converted general format limit(IR, VR, VFP, DVR, DIR, VFS and IRS) to scientific format limit for device SBRS8140T3G.

e.g. 21.080uA ==> 2.11E-05

224.64pF ==> 2.2464E-10

- Used SYA Tool to copy approved limit for particular SZ devices.

18.06.2010(Friday)

==================

- Used SYA Tool to copy limit of normal SMA devices to SMA special devices.(Characterization).

week 10

07.06.2010(Monday)
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- Replacement holiday for Agong's birthday..:)

08.06.2010(Tuesday)
===================
- Updated SO8 Flat Lead Yield Loss Monitoring and Focus Defect for week 22.
- Uploaded VFP min limit = 0.2 for SMB SZ devices.

09.06.2010(Wednesday)
=====================
- Continued upload VFP min limit = 0.2 for SMB SZ devices.
- Uploaded VFP min limit = 0.2 for SMB normal devices.

10.06.2010(Thursday)
====================
- Recorded standoff readings for powermite machince. Machine numbers: Q2, Q17, Q19, Q20 and Q25.
Recorded 100 readings for each machine.
- Continued upload VFP min limit = 0.2 for SMB normal devices.

11.06.2010(Friday)
==================
- Continued upload VFP min limit = 0.2 for SMB normal devices.
- Explanation on the use of Statistical Yield Analysis(SYA) tool by assistant supervisor.

~ Overall, this week focused on uploading VFP min limit for SMB devices because the due
date was near..:D

week 9

31.05.2010(Monday)
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- Updated SO8 Flat Lead Weekly Yield Monitoring and Focus Defect for week 21.
- Updated Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Updated GRR and bias study for machine P41 and P1.

* Bias study is testing a unit for few times by using the same machine and see how much the
difference(biasing) between the readings recorded.

01.06.2010(Tuesday)
===================
- Continued Update Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Prepared and reviewed the presentation slides with supervisor for internship lecturer visiting.
- Lecturer visiting: 4.00pm - 4.45pm

02.06.2010(Wednesday)
=====================
- Updated GRR, Bias study, Linearity and Stability for machine of type 881. (limit updated:VDSON).
- Learned how to do mapping.
- Continued Update Front End, Back End and Final Test yield loss for 8 types of packages for May 2010.
- Updated Linearity and Stability for machince P36(FT2 and QA).

03.06.2010(Thursday)
====================
- Updated VFP min limit = 0.2 for SMB devices.
- An Excel file was downloaded after the mapping process done yesterday. So, today I needed to
update machine name, final test output quantity, final test yield loss percentage, PAT_LKG
limit for SAW, DIE BOND and FINAL TEST processes in the Excel file.

04.06.2010(Friday)
==================
- Updated IRS current max limit to proposed limit for SMA devices.
- Continued upload VFP min limit = 0.2 for SMB devices.