12.04.2010(Monday)

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I learned program testing by using concurrent DOS operating system. The program testing is actually wanted to change the parameter of VF/VFP of the devices to minimum limit= 0.2. The functions of the DOS are change the parameter, update sort parameter, update program run and etc. The process engineer, Mr. Muzhafar had taught me the commands for the specific functions. I was slow at the beginning but then i getting more familiar with it after few updating steps were done.

The examples of commands used:

PT- Enter the name of the test file which is with .TES extension

PR- Enter the name of the run file which is with .RUN extension

UP- Update priority with sort changes

Ctrl Z- To exit the execution of the program

The data is stored in diskette. Since program testing have to use two computers, therefore i need to eject and insert the diskette into both computers alternatively. It took time because there are many files waiting for me to update.

13.04.2010(Tuesday)

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I did data upload for today. I need to browse the SMB folder and check whether the value of the VF/VFP has been changed or not.

Besides that, I had learned 8 types of semiconductor package that produced by my department(Department of Power Products Division). There are:

- SMA(YE)
- SMB(Y4)

- SMC(Y5)

- PMITE(PM)

- SOD123(YB)

- SO8(TR)

- u8FL(IF)

- SFET(CU)

I will update the details for each package later. After that, I had updated the percentage of yield loss for each package in the MS Excel. In addtion, Mdm. CC Lim also explained some of the process of the machines to me.